Titanium Nitride (TiN) Thin Film Analysis Using Torontech FRINGE Grazing Incidence X-ray Diffraction (GIXRD)
Understanding the structure and crystallinity of ultra-thin Titanium Nitride (TiN) coatings is crucial for quality control and product performance, especially in microelectronics, optics, and surface engineering. This article explores how Torontech’s Benchtop XRD Analyzer – X-ray Diffractometer – FRINGE Family, using Grazing Incidence X-ray Diffraction (GIXRD), provides accurate phase analysis and crystallinity data for TiN […]
