INSIGHT Universal Version For Small Parts
Provide accurate analysis for miniaturized products
The INSIGHT Universal Version For Small Parts is designed as a 'top-down' coating analyzer, featuring a compact appearance, space-saving design, user-friendly operation, rapid analysis, and precise detection.
The INSIGHT Universal Version For Small Parts utilizes a micro-focusing X-ray tube to capture the majority of rays emitted from the X-ray source and concentrate them into a tiny beam spot. This spot is then directed onto the sample, achieving excellent spatial resolution and generating a strong fluorescence signal. The device collects, processes, and analyzes the fluorescent signal produced by the sample when irradiated. This data is obtained through an energy spectrum probe and subsequent data processing, providing composition information about the sample. This technology allows for rapid measurement and precise analysis, particularly beneficial for complex applications. It is well-suited for elemental analysis of heterogeneous or irregularly shaped unknown samples, as well as microscopic objects.
INSIGHT Universal Version For Small Parts finds extensive use in elemental analysis and thickness detection of samples with both conventional and intricate coating structures. Particularly effective for samples with uneven, irregular, or minute shapes, it ensures customers receive dependable, repeatable results across a wide range of applications. These applications include jewelry, small parts, connector plating, general circuit boards, and more.
PCB Surface Treatment Processes
In PCB surface treatment processes, common methods include hot air leveling, organic coating OSP, electroless nickel plating/immersion gold, immersion silver, immersion tin, and electroplating nickel gold, among others. INSIGHT offers rapid, efficient, non-destructive, and precise analysis of PCB coating thickness and composition across various shapes.
Jewelry
Electroplating enhances the appearance and protects the metal surface of jewelry, making it more aesthetically pleasing. Standards for jewelry electroplating vary across countries. Currently, the standard used in my country is "General Technical Conditions for Precious Metal Coated Ornaments - Electroplating QB T 4188-2011." To meet market quality demands and adhere to industry standards, INSIGHT is well-suited for inspecting the thickness and composition of single-layer and multi-layer jewelry, regardless of their shapes.
Electronic Component
The advancement of coating technology and electronic components mutually benefit each other. As societal development accelerates, the performance demands placed on electronic components are progressively rising, making coating technology increasingly vital. To ensure the stability and reliability of electronic products, detecting and screening the coatings of electronic components is crucial. Common electronic component coatings include tin-silver (Sn-Ag), tin-bismuth (Sn-Bi), tin-copper (Sn-Cu), pre-plated nickel-palladium-gold (Ni-Pd-Au), and others.
Universal Small Parts and Small Structures
With the rapid advancement of science and technology, parts across various industries are increasingly miniaturized. As a crucial surface treatment method for small parts, the coating process is categorized into rack plating, barrel plating, continuous plating, and brush plating.
Multi-Collimator
You have the option of using multiple collimators, or the software can automatically switch between different combinations of collimators as needed. This flexibility allows the system to effectively handle parts of varying sizes.
One-Touch Measurement
The instrument comes with user-friendly and intelligent analysis software, making it easy to operate. Users can test samples without any specialized training. Simply click on "Start Test," and within seconds, you'll have the test results at your fingertips.
Auto Focus
Samples of different shapes can be swiftly and precisely focused, with the capability to zoom in on video images and include crosshairs. The autofocus feature ensures clarity and accuracy.
Programmable Automatic Displacement Sample Stage
The INSIGHT system offers both fixed and motorized automatic stages, which can be programmed to accommodate a wide range of part sizes and test volumes. A fixed sample stage suffices for spot inspections of one or several locations on the circuit board, where the inspection area is easily identifiable. Users can manually position the sample using a fixed stage. However, boards with intricate designs and extremely small features benefit from a motorized stage, offering greater precision for adjustments. Moreover, INSIGHT enables the creation, saving, and recall of multipoint programs for automated testing of multiple components. Combining a programmable XY stage with built-in pattern recognition software ensures efficient and consistent high-volume sample testing.
High-Performance Detector
We opt for Si-PIN detectors tailored for multi-element coatings. In contrast to traditional gas proportional counters, Si-PIN offers superior resolution, lower background noise (resulting in the highest signal-to-noise ratio), long-term stability, and an extended service life.
Large Measurement Room
The instrument shell features a slotted design (C-slot), which widens the measurement space and facilitates easy placement of samples. This design allows for the measurement of large and flat items, such as printed circuit boards, as well as accommodating large samples with intricate shapes.
Nondestructive Testing
X-ray fluorescence is a non-destructive analytical process that leaves no traces, ensuring the safety of sensitive materials during measurement.
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The characteristics of |
Top-down measurement structure, XYZ measurement platform, MUTI-FP multilayer algorithm
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Scope of element |
Na(11)—Fm(100)
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Analysis of the layer number of |
5 layers (4 layers + substrate) each layer can analyze 10 elements, composition analysis can analyze up to 25 elements
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X-ray tube |
50 W (50 kV, 1mA) micro-focused tungsten palladium ray tube (target material is optional)
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The detector |
Si-PIN large area detector
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Collimator |
φ0.5-φ5 is optional. Multi-standard is optional
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The camera |
High resolution CMOS color camera, 5 megapixels
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Manual sample XY platform |
Moving range：100 x 150 mm
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Programmable XY platform |
(Optional)
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Z-axis range of movement |
150 mm
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Sample bin size |
564×540×150mm(L x W x H)
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Overall dimensions |
664×761×757mm(L x W x H)
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Weight |
120KG
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The power supply |
AC 220V±5V 50Hz (110V also available)
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Rated power |
150W
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How Can We Help You?
Contact our sales team for a quotation.
